摘要
本文提出了在低压气相生长金刚石薄膜系统中,Si衬底表面微蚀坑对金刚石成核的阻止效应,较好地解释了实验上发现的原子氢刻蚀Si衬底产生的微缺陷对金刚石成核破坏作用的机理。
In this paper,the obstraction effect of minute etching pits on Si substrates on diamond nucleation have been put forward in diamond films growth by low pressure vapor phase methods,The phenomenon that minut defects from atomic hydrogen etching Si substrates damage diamond nucleation by experiment found was reasonably explained
出处
《人工晶体学报》
EI
CAS
CSCD
1994年第3期215-218,共4页
Journal of Synthetic Crystals
关键词
成核
金刚石薄膜
硅
衬底
刻蚀
diamond
film
nucleation
defect
atomic hydrogen
etching
diamond film