摘要
用X射线衍射法测定FeNi合金薄带的残余应力及其分布,探讨工艺参数对薄带残余应力影响的规律。
The residual stress and its distribution in the FeNi alloy thin
strip have been measured by X-ray diffraction.The effect of processing para-meies on the residual stress of the thin strip is investigated.
出处
《上海钢研》
1994年第6期29-31,共3页
Journal of Shanghai Iron and Steel Research
