利用加权积分能谱识别薄层

Thin-layer recognition by means of weighted integrated energy spectrum

影响薄层的反射于波频谱幅值的主要参数之一是岩层的厚度d。当偶极厚度不同时，其反射波函数频谱曲线特征不同。通过反射信息的频谱分析，可以借助其反射波主频与入射子波主频间的差别发现薄层并估算出其厚度。在地下存在薄互层或更为复杂地层的情况下，利用一般振幅频谱分析法难以分辨时，可以采用分辨能力更高的积分能借（INTENS）分析法。本文计算了基本的积分能谱。为了充分利用积分能谱分辨薄层，我们对积分能谱公式进行了改进，即加权积分能谱。加权积分能谱比一般的积分能谱识别薄层效果好。

The thickness of a thin layer is one of the principal parametors which affect the spcctrun amplitude of reflection wavelet emcrging from the thin layer. Different dipolar thicknesscs give rise to different characteristics of reflection spectrum. Consequently,thc discovcry of a thin layer as well as the estimation for its thickness can be done based on the dominant frequcncy discropancy between the reflection and its corresponding incident wavclet via some spectrum analysis. In case there exist thin intorbedded or more complex layers in subsurface when the average spectrum analysis fails to resolve them,an alternative termed 'integrated energy spcctrum analpeis (INTENS)' which is more powerful in resolution is of consideration. The 'weighted integrated spectrum' method proposed in the paper is an improvement on the INTENS,which has been proved further powerful in rcsolving thin layers.