摘要
本文介绍一种智能功率集成电路(高边CMOS模拟开关)的隔离技术。对除开关管VDMOS管以外的器件采用自隔离技术,VDMOS管不是自隔离的。衬底电势的变化易引起电路闭锁,采用浮阱技术来防止电路闭锁。
n isolation technology for smart power IC's (high-side CMOS analog switch) is presentedin the paper.Selfisolation is adopted for all the devices in the study except VDMOS transistors. Floating well has been used to prevent thecircuit from latching-up,which can be easily caused by variations in subetrate potentiais.
出处
《微电子学》
CAS
CSCD
1994年第2期12-16,共5页
Microelectronics
关键词
模拟开关
隔离
闭锁
功率集成电路
smart power IC ,High-side analog switch, Self isolation .Flogting Well.Latch-up