摘要
采用全外延工艺,研制了X波段里德型双漂移崩越二极管所需πpnγN ̄+多层外延材料,分析了各过渡区的形成机理及减小其宽度的方法,实现了陡峭的杂质浓度分布。
Multi epitaxial layers used for X-band double drift Read impact avalanch and transit time diodes have beenprepared using full epitaxy process. Mechanisms for the formation of each transit region are examined and procedures tominimize the width of the transit regions are discussed.An abrupt doping profile has been attained.
出处
《微电子学》
CAS
CSCD
1994年第3期52-56,共5页
Microelectronics
关键词
崩越二极管
外延生长
材料
硅
Si epitaxy. Auto-doping, X-band, Double drift Read IMPATT diode