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系统芯片测试策略--IEEE P1500 被引量:2

Test Strategy for SOC--IEEE P1500
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摘要 IEEEP1500标准旨在增强嵌入式核应用商和提供商之间的交流,为SOC的测试确定标准,以确保系统芯片的快速上市,降低芯片的开发周期和开发成本。从IEEEP1500标准的目的与意义、该标准定义的系统结构、标准的制订原则、测试的实现方式等角度对该标准进行详细的剖析,指出了该标准目前的进展状况和存在的问题,以及该标准与其他相关协议之间的关系。 IEEE P1500 is aiming at enhancing the communication between core providers and core users to ensure the time to market of system ICs and to reduce the cycle of design and the cost. From several angles including the significance and purpose, the architecture of this standard, the rules in framing the protocol and the methods to implement the standard, a detail information about IEEE P1500 Standard is given. Furthermore, the situation of the standard and some problems are proposed, and the relationship between this standard and others are given.
出处 《计算机测量与控制》 CSCD 2005年第2期113-115,共3页 Computer Measurement &Control
关键词 集成电路 系统芯片 测试策略 IEEE P1500 <Keyword>SOC IEEE P1500 embedded core
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参考文献4

  • 1IEEE P1500 general working group website. IEEE P1500 standards for embedded core test [EB/OL]. http: //grouper. ieee. org/groups/1500.
  • 2IEEE Std 1149.1- 2001. IEEE standard test access port and boundary--scan architecture[S]. 2001, 3--5.
  • 3IEEE Std 1149.4--1999. IEEE standard for a mixed signal test bus[S]. 1999, 10--12.
  • 41149.5--1995 IEEE standard {or module test and maintenance bus(MTM--Bus) protocol [S]. 1995, 4--5.

同被引文献15

  • 1刘建强,李智.SOC中嵌入式核测试标准IEEEP1500综述与研究[J].国外电子测量技术,2005,24(5):17-20. 被引量:5
  • 2吴超,王红,杨士元.基于复用的SOC测试集成和IEEEP1500标准[J].微电子学,2005,35(3):240-244. 被引量:12
  • 3张琨,杨松华.基于IEEE P1500的SOC可测性设计技术[J].电子技术(上海),2005,32(8):62-66. 被引量:2
  • 4RochitRajsuman.SoC设计与测试[M].北京:北京航空航天大学出版社,2003,4..
  • 5IEEE Std 1500,IEEE Standard Testability Method for Embedded Core-Based Integrated Circuits[S].2005.
  • 6Zorian Y.Test requirements for embedded core-based systems and IEEE P1500[A].Proc.International Test Conference[C].1997:191-199.
  • 7Erik Jan Marinissen,et al.On IEEE P1500's standard for embedded core test[J].Journal of Electronic Testing:Theory and Applications,2002,18 (4/5):365-383.
  • 8Eric Jan Marinissen,Rohit Kapur,Yervant Zorian.On using IEEE P1500 SECT for test plug & play[A].Proc.International Test Conference[C].2000:770-777.
  • 9Kapur R,Keller B,Koenemann B,Lousberg M,Reuter P,Taylor T,and Varma P.P1500-CTL:towards a standard core test language[A].Proc.VLSI Test Symposium[C].1999:489-490.
  • 10Kapur R,Lousberg M,Taylor T,Keller B,Reuter P,Kay D.CTL the language for describing core-based test[A].Proc.International Test Conference[C].2001:131-139.

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