摘要
本文提供了一类全新型无焊压装IGBTs的机械和电气可靠性的大量试验结果。实验内容包括:振动、冲击、热循环,也包括集电结和发射结和门的电疲劳使用期限。实验证明该类器件可用于可靠性要求高和寿命要求长的应用场合。
The results of extensive mechanical and electrical reliability testing of a new totally bondless pressure contact device are presented. The test program included, vibration, shock, thermal cycling as well as electrical endurance of both the collector emitter junction and the gate. The devices are determined to meet the needs of application requiring devices of high reliability and durability.
出处
《变频器世界》
2005年第2期113-117,共5页
The World of Inverters
