X射线非晶硅面阵探测器B级像质的研究

The Analysis of Level B Imaging Quality Based on the X-Ray Flat-Panel Detector

基于非晶硅面阵探测器的检测技术代替胶片成像已成为今后射线检测的发展方向。尽管该方法优点众多,但在需求多变的工业射线检测中,其成像质量无法达到胶片B级的像质。以PaxScan系列非晶硅面阵探测器为例,通过分析影响成像质量的原因和探测器性能,确定最佳成像的实验条件,对系统成像进行预处理和后续处理后,成像质量明显提高。实验证明,信号处理后的成像对比度优于B级成像,并在某航空发动机叶片的工业在线检测中取得了较好的效果。

The developing trend of X ray testing technology is to use the amorphous silicon flat panel detector (α Si FPD) instead of film screen images. Although it has many advantages, its imaging quality cant be better than that of film screen (level B). In the case of PaxScan α Si FPD, by analyzing the reasons for affecting the imaging quality and the performance of α Si FPD, the best experiment condition is determined and the image is processed by pre processing and post processing. So the imaging quality is obviously improved. The contrast image is much better than level B and the industry on line test of blade has made better effect.