异质面GaAs太阳电池n层少子产生寿命的测量

Characterization of Generation Lifetime in the n-Region for Heteroface GaAs Solar Cell

使用简单的微分电流和微分电容技术，从反向偏置的Ｉ－Ｖ和Ｃ－Ｖ数据计算异质面ｐｐｎＧａＡｓ太阳电池ｎ层少子产生寿命剖面图。讨论它对电池性能的影响。

The generation lifetime profile in the n-region of a ppn GaAs heterofacesolar cell had been determined by using a simple differential current and capacitance tech-nique from the reverse-biased I-V and C-V data. The effect of generation lifetime on cell per- formance waiq discussed.