摘要
A new fault model, called the X-fault model, is proposed for fault diagnosisof physical defects with unknown behaviors by using X symbols. An efficient X-fault simulationmethod and an efficient X-fault diagnostic reasoning method are presented. Fault diagnosis based onthe X-fault model can improve the accuracy of failure analysis for a wide range of physical defectsin complex and deep submicron integrated circuits.
A new fault model, called the X-fault model, is proposed for fault diagnosisof physical defects with unknown behaviors by using X symbols. An efficient X-fault simulationmethod and an efficient X-fault diagnostic reasoning method are presented. Fault diagnosis based onthe X-fault model can improve the accuracy of failure analysis for a wide range of physical defectsin complex and deep submicron integrated circuits.
