摘要
This paper proposes an effective method for reducing test data volume undermultiple scan chain designs. The proposed method is based on reduction of distinct scan vectorsusing selective don't-care identification. Selective don't-care identification is repeatedlyexecuted under condition that each bit of frequent scan vectors is fixed to binary values (0 or 1).Besides, a code extension technique is adopted for improving compression efficiency with keepingdecompressor circuits simple in the manner that the code length for infrequent scan vectors isdesigned as double of that for frequent ones. The effectiveness of the proposed method is shownthrough experiments for ISCAS'89 and ITC'99 benchmark circuits.
This paper proposes an effective method for reducing test data volume undermultiple scan chain designs. The proposed method is based on reduction of distinct scan vectorsusing selective don't-care identification. Selective don't-care identification is repeatedlyexecuted under condition that each bit of frequent scan vectors is fixed to binary values (0 or 1).Besides, a code extension technique is adopted for improving compression efficiency with keepingdecompressor circuits simple in the manner that the code length for infrequent scan vectors isdesigned as double of that for frequent ones. The effectiveness of the proposed method is shownthrough experiments for ISCAS'89 and ITC'99 benchmark circuits.
