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螺旋慢波系统高频特性的计算机仿真 被引量:2

Simulation of High-Frequency Characteristic for Helical Slow-Wave System
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摘要 介绍了用德国CST(Computer Simulation Technology)公司提供的微波工作室MWS (Microwave Studio)4.2软件模拟计算螺旋线慢波系统的色散特性和耦合阻抗的理论方法。通过对矩形夹持杆支撑螺旋慢波结构的模拟计算,与测试结果相比色散特性的平均模拟误差为1.5%左右,耦合阻抗的平均误差为 0.3%左右;相比于 MAFIA仿真,计算精度更高,计算时间更短。 With the Microwave Studio4.2 software provided by the German Computer Simulation Company, the basis method of simulating the dispersion characteristics and interaction impedance for helical slow-wave circuit is described. The simulation for a helical slow-wave circuit supported by three rectangular rods is done with the Microwave Studio4.2. Compared with the measured results, the average error of dispersion simulation result reaches less than 1.5%, and that of impedance less than 0.3%. Compared with MAFIA, CST Microwave Studio4.2 has high simulation accuracy and short simulation time.
出处 《电子器件》 EI CAS 2005年第1期110-113,共4页 Chinese Journal of Electron Devices
基金 国防科技基础研究基金资助项目 编号:51440030203DZ02。
关键词 计算机仿真 CST 螺旋线慢波系统 色散特性 耦合阻抗 computer simulation CST helical slow-wave circuit dispersion characteristics interaction impedance
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  • 1Jain P K, Basu B N. The Inhomogeneous Loading Effects of Practical Dielectric Supports for the Helical Slow-wave Structure of a TWT[J]. IEEE Trans Electron Devices, 1987,34(12):2643-2648.
  • 2Kapoor S, Raju R S, Gupta S N, et al. Analysis of an Inhomogeneously Loaded Helical Slow-wave Structure for Broad-Band TWT's[J]. IEEE Trans Electon Devices, 1989,36(19):2000-2005.
  • 3Jung S S, Baik C W, Han S T, et al. 1.5 Octave wideband Traveling-wave tube with heavily- loaded helical slow-wave structure[C]. In: IEEE Conference Record- Abstracts on Pulsed Power Plasma Science , 2001:280.
  • 4Kory C L. Validation of an accurate three dimensional helical slow-wave circuit model[R]. NASA Technical Paper, 1997:4677.
  • 5Agostino S D, Emma F, Paoloni C. Accurate analyse of helix slow-wave structures[J]. IEEE Trans Electron Devices, 1998 ,45(7): 1605-1613.
  • 6Greninger P. Quasi-Three-Dimension Perturbation Technique, Including Dielectrics for TWT's[J]. IEEE Trans Electon Devices, 1994,41(3):445-451.
  • 7张兆蹚.微波管高频系统的测量[M].北京:国防工业出版社,1982..
  • 8Greninger P. Tape Helic Perturbation Including 3-D Dielectrics for TWT's[J]. IEEE Trans Electon Devices,2001,48(1):12-23.
  • 9王劲松.[D].北京12所,2001.

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