摘要
XH-REP-2正性电子束抗蚀剂的工艺研究王国荃,罗腾蛟,王琴美,吴月莉(中国科学院上海冶金研究所)关键词:电子束曝光,等离子体去渣.0引言普通光学的曝光分辨率受到光波衍射效应的限制,难以制作1μm以下的图形;当PG图形分割的矩形数超过20万,普通光...
This paper describes briefly the principle and characteristics of electron-beamlithography.The mechanism of the interaction of energetic electrons with resistmaterials is also described.The whole processing of XH-REP-2 positive electron-bcam resists discussed in detail. We have found a group of optimal parametersof XH-REP-2 positive electron-beam resists and come to the conclusion thatXH-REP-2 positive electron-beam resists have high resolution and sensitivity.
出处
《应用科学学报》
CAS
CSCD
1994年第1期88-91,共4页
Journal of Applied Sciences