一种用于嵌入式内存测试的高效诊断算法

An Efficient Diagnosis Algorithm for the Test of Embedded SRAM

提出了一种具有自诊断功能的位定向MARCH TB+算法,并在此算法的基础上,用共享型内建自测试电路结构完成了2k×1位嵌入式内存的测试和诊断.实验结果表明,提出的这种测试算法具有较高的故障覆盖率和较强的故障诊断能力,同时兼有测试长度短的优点.

This paper puts forward an self-diagnosis bit-oriented algorithm(MARCH-TB+), according to the testing algorithms,we use a shared built-in-self-test structure(parallel structure) to test and diagnose embedded SRAM(2k×1). The experimental results show that the proposed testing algorithm has high fault coverage, strong diagnostic ability and requires less testing time.