蚂蚁算法在时序电路测试生成中的应用研究

Study on Automatic Test Generation of Sequential Circuits Using Ant Algorithm

数字集成电路的发展对测试提出了日益紧迫的要求 ,测试已成为妨碍LSI/VLSI付诸应用的瓶颈问题。尤其时序电路的测试生成 ,理论上是个没有完全解决的问题。通过结合电路的结构信息 ,提出了基于蚂蚁算法的时序电路自动测试生成 ,该算法分初始化和故障检测两个阶段实现。实验结果表明 ,基于蚂蚁算法的测试生成能取得较好的故障覆盖率 ,并且测试生成所耗费的CPU时间非常短 ,说明这是个值得探索的方法。

The development of digital integrated circuit has put forward urgent demands for test technology. Test technology has become a bottleneck in the application of LSI/VLSI. Especially for sequential circuits, it is still a problem which is not resolved completely in theory. By making use of the structure information of circuits, a method of automatic test generation for sequential circuits based on ant algorithm is presented, which is performed by two steps, initialization and fault detection. Experimental results show that the approach can achieve high fault coverages, and CPU times needed for test generations are very short, which shows that it is a method deserving research.