9—46keV电子引起的Ni的K壳层电离截面

K-IONIZATION CROSS SECTIONS OF THE NICKEL ATOM BY 9-46 keV-ELECTRON IMPACT

用Ｓｉ（Ｌｉ）探测器测量薄Ｎｉ靶在９—４６ＫｃＶ的电子轰击下产生的Ｋ壳层特征Ｘ射线，以确定其Ｋ壳层电子的电离截面。测量结果与前人的实验和理论计算以及经验公式的计算结果作了比较。

In this paper, K-ionization cross sections of Ni by electron impact (impact energy 9 46keV) was measured detecting characteristic X-ray emitted by thin solid film targets of knowh mass thickness with a Si(Li) detector. The experimental results are compared with previous and theoretical calculations and empirical formula calculstions.