摘要
射频集成电路(RFIC)是无线通信、雷达等电子系统中非常关键的器件,由于其高频特点,准确评估RFIC的性能具有相当的难度。文章以射频低噪声放大器(LNA)为例,运用微波理论,分析了RFIC典型参数,如S参数、带宽、P1dB、OIP3以及噪声系数等的测试原理和测试方法,并对影响RFIC性能测试的主要因素进行了分析。最后,给出了一种LNA电路的测试结果。
Radio Frequency integrated circuit (RF IC) is a key device in electronic systems for radar and wireless communications. It is quite hard to evaluate RF IC's performance accurately due to its high operating frequency. With RF low noise amplifier (LAN) as an example, the principle and methods for testing RF IC's typical parameters, such as S parameter, bandwidth, P1dB, OIP3 and noise figure, are analyzed based on the microwave theory. Major factors concerning RF IC's performance test are investigated. Finally, test results of an LNA circuit are presented.
出处
《微电子学》
CAS
CSCD
北大核心
2005年第2期110-113,共4页
Microelectronics
