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一种40 ns 16 kb EEPROM的设计与实现 被引量:5

Design and Implementation of a 40-ns 16-kb EEPROM
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摘要  基于0.35μmCMOS工艺,设计并实现了一个3.3V16kbEEPROM存储器。该电路采用2k×8的并行结构体系。通过优化设计灵敏放大器、位线译码和字线充放电等电路,加快了读取速度,典型值仅40ns;通过编程模式和编程电路的设计,提高了编程速度,页编程时间为2ms,等效于每字节62ms。重点研究了片上高压产生电路,提出了一种在不增加工艺难度和设计复杂度的情况下提供良好性能的电荷泵电路。电路的单元面积为11.27μm2,芯片尺寸约1.5mm2。 A 2 k×8 bits EEPROM based on 0.35 μm CMOS process is developed, which operates from a single 3.3 V power supply. Several design techniques are summarized. An improved readout circuit consisting of sensing amplifier (SA), bit-line decoding and word-line charge/discharge circuit to minimize the access time is described in particular, along with the approach to optimizing the programming operation. Emphasis is made on the on-chip high-voltage generation circuit, and a zero threshold voltage charge pump is proposed, which can improve the performance without additional design and process complexity. A 40 ns typical access time and 2 ms page programming time are achieved. The cell size is 11.27 μm^2 and chip size is about 1.5 mm^2.
出处 《微电子学》 CAS CSCD 北大核心 2005年第2期133-137,共5页 Microelectronics
基金 国家自然科学基金资助项目(60236020)
关键词 EEPROM 存储器 电荷泵 灵敏放大器 并行编程 EEPROM Memory Charge pump Sensing amplifier Parallel programming
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参考文献4

  • 1Cappelletti P, Golla C, Olivo P, et al. Flash memories[M], Boston/ Dordrecht/ London: Kluwer Academic Publishers, 1999.
  • 2Lucero E M, Challa N, A 16 kbit smart 5 V-only EEPROM with redundancy[J]. IEEE J Sol Sta Circ, 1983, 18(5): 539-544.
  • 3Daga J M, Papaix C, Racape E, et al. A 40 ns random access time low voltage 2 M bits EEPROM memory for embedded applications[A]. MIDT[C]. 2003.
  • 4Dickson J F. On-chip high-voltage generation in NMOS integrated circuits using an improved voltage multiplier technique[J]. IEEE J Sol Sta Circ, 1976, 11(3): 374-378.

同被引文献16

  • 1冀康灵,刘志弘,朱钧,潘立阳,伍冬,肖方兴.用于RFID的EEPROM技术及IP设计[J].微电子学,2006,36(1):12-15. 被引量:5
  • 2阙金珍,刘红侠,郝跃.电荷泵电路功耗优化设计及改进[J].微电子学,2006,36(3):373-376. 被引量:2
  • 3姚亚峰,陈建文,黄载禄.嵌入式系统中EEPROM接口及控制电路设计[J].半导体技术,2007,32(4):328-331. 被引量:13
  • 4[1]武汉力源电子股份有限公司.X84041数据手册[Z].1998.
  • 5GIOVANNI C, MICHELONI R, NOVOSEL D VLSI-design of non-volatile memories [M]. USA Springer, 2005: 269-301.
  • 6KATAOKA T, FUCHIGAMI I, NISHIDA , et al. A 1. 4 V 60 MHz access, 0. 25 tm embedded flash EEPROM [C // Proc IEEE Custom Integr Circ. San Diego, CA, USA. 1999: 243-246.
  • 7CHRISANTHOPOULOS A, MOISIADIS Y, VARAGIS A, et al. A new flash memory sense amplifier in 0. 18 tm CMOS technology EC // 8'h IEEE Int Conf Elec, Circ Syst. 2001, (2): 941- 944.
  • 8PAPAIX C, DAGA J M. A new single ended sense amplifier for low voltage embedded EEPROM non volatile memories EC // Proceed IEEE Int Works Memory Technol, Design Testing. 2002 149-153.
  • 9SEOMK, S[MSH, OHMH, etal. A130-nm0.9- V 66MHz 8Mb (256 k 32) local SONOS embedded flash EEPROM [J]. IEEE J Sol Sta Circ, 2005, 40 (4) : 877-883.
  • 10D[ML C, JANKOWSHI M, THALMAIER C. A 0.13 /zm 2. 125 MB 23. 5 ns embedded flash with 2 GB/s read throughput for automotive microeontrollers [C] // Proc ISSCC Dig Teeh Pap. 2007: 478-479, 617.

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