MOS结构准静态测试中的异常C-V曲线

The Anomalous C-V Curves of MOS Structures in Quasi-Static Measurement

本文报导了MOS结构在准静态测试中的异常电容-电压曲线。讨论了它们产生的原因。

The anomalous curves of MOS structures in quasi-static capacitance-, oltagc measurements are reported in this paper, and reasons for the generation of these curves are discussed.