"神舟3号"上生长Cd_(1-x)Zn_xTe晶片Zn组分分布的显微荧光研究

Study on Zn composition distributions in Cd_(1-x)Zn_xTe wafers grown in the Shenzhou 3 by micro-photoluminescence

用显微荧光(μPL)方法对在我国"神舟3号"上空间生长的CdZnTe晶片中Zn组分分布的研究。对晶片的单晶"壳"区及未完全熔化的"芯"区中的小结晶区域进行了逐点PL测量.对测得每点的PL谱进行了拟合,得到测量点的禁带宽度参数Eg,其分布对应于CdZnTe中Zn的组分分布。测量结果给出了空间生长品片Zn组分布的变化趋势和统计规律.作为比较,测量并分析了一块采用相同方法在地面生长的CdZnTe 晶片。

We report the study on Zn composition distributions in Cd0.96Zn0.04Te wafers grown in Shenzhou 3 spacecraft by micro-photoluminescence (μ-PL). The PL is performed over the crystalized ' crust ' region and the plateau regions in the ' core ' which are surrounded by non-crystalized solvent and resulted from incomplete melting of the raw material during the growth. Each PL spectrum has been fitted theoretically, resulting in the energy band gap Eg. The distributions of Eg are correlated to the Zn composition distributions. The results give out the variation trend and the statistical characteristics of the Zn composition distributions. An earth-grown CdZnTe wafer has been measured for comparison.