摘要
详细研究了利用硅的各向异性腐蚀、各向同性腐蚀制备硅锥阴极阵列的工艺。采用快速腐蚀与缓蚀削尖两步工艺,制备出了均匀、尖锐的硅锥阵列。其阵列密度可达106/cm2,硅锥曲率半径可做到20nm。
A technique for the fabrication of silicon cone cathode array by using anisotropic and isotropic etching has been reported in this paper. By two-step method with rapid and buffer-sharpener etching,silicon cone array with uniformity and sharpness has been fabricated. Its density is 106/cm2,the tip curvature radius is about 20nm.
出处
《真空科学与技术》
EI
CAS
CSCD
1994年第6期426-430,共5页
Vacuum Science and Technology
关键词
各向异性
腐蚀
各向同性
两步法
硅锥
集成电路
Anisotropic etching,Isotropic etching,Two-step method,Silicon cone