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Y形和Y环形单元特性的实验对比研究 被引量:41

Experimental comparison of the characteristics of Y element and Y loop element
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摘要 采用镀膜和光刻技术设计并制备出了2种衬底厚度不同的Y孔单元和Y环孔单元的FSS,在0°和45°入射角下分不同的极化波进行了测试,经对比研究发现,在大角度入射下Y环单元FSS比Y孔单元FSS有更为稳定的中心频率,更窄的带宽;Y环单元FSS对垂直和水平极化波的适应性更强,滤波特性较Y孔单元FSS更明显;介质厚度的变化对Y孔中心频率、带宽的影响要比Y环单元FSS的大得多。所以,从中心频率、带宽随介质衬底厚度、入射角度、不同极化方式的变化情况看,Y环单元比Y孔有更稳定的性能。 With filming technology and lithography, two sorts of FSS i.e. Y-aperture element FSS and Y-loop element FSS on different thickness substrates arc presented. And the tests under two different polarized waves at 0° and 45° incidence angle are given. The results show that at wide angle, Y-loop element FSS has more stable center frequency and narrower bandwidth than Y-aperture element FSS; Y-loop element FSS is more adaptive to vertically and horizontally polarized wave than Y-aperture element FSS, and its filtering characteristic is more obvious as well; The center frequency and bandwidth of Y-aperture arc much more influenced by the substrate thickness change than those of Y-loop clement FSS. So from the changes in center frequency and bandwidth versus dielectric substrate thickness, incident tingle, direction of polarization, it can be seen that Y-loop element has more stable characteristics than Y-aperture.
出处 《光学精密工程》 EI CAS CSCD 北大核心 2005年第2期219-224,共6页 Optics and Precision Engineering
关键词 频率选择表面 垂直极化 水平极化 Arrays Bandwidth Dielectric materials Electromagnetic waves Film preparation Frequencies Lithography
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参考文献10

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