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基于AFM的Si纳米结构的加工 被引量:1

Si Nanofabrication by AFM
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摘要 介绍了通过使用原子力显微镜,在H钝化Si(100)的表面局部阳极氧化反应的表面氧化图案上刻写的纳米级Si 结构加工。这种氧化图形可被用作Si的可选择性蚀刻工艺的掩膜。带有临界特性的小到30 nm的边门Si 场效应晶体管也通过这种方法加工。 Introduced the fabrication of nanometerscale Si structures by using an atomic force microscope to write surfaceoxide patterns by the local anodic oxidation of a Hpassivated Si (100) surface.These oxide patterns were used as masks for selective etching of the silicon.Sidegated Si field effect transistors with critical features as small as 30 nm have been fabricated by this method.
机构地区 浙江工业大学
出处 《机械与电子》 2005年第4期54-56,共3页 Machinery & Electronics
基金 浙江省自然科学基金(501096)
关键词 纳米加工 硅纳米结构 原子力显微镜 阳极氧华 nanofabrication silicon nanostructures atomic force microscope anodic oxidation
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参考文献10

  • 1Wada Y.Possible application of micromachine technology for nanometer lithography[J].Microelectronics Journal,1998,29:601-611.
  • 2Jortner J,Ratner,et al.Molecular Electronics:A Chemistry for the 21st Century[M].International Union of Pure and Applied Chemistry,Blackwell Science,1997.
  • 3Snow E S,Campbell P M.Proximal probe-based fabrication of nanometer-scale devices[J].Materials Science and Engineering,1998,51:173-177.
  • 4Avouris P H.Manipulation of matter at the atomic and molecular levels[J].Acc Chem Res,1995,28:95-102.
  • 5Day H D,Allee D R.Selective area oxidation of silicon with a scanning force microscope[J].Appl Phys Lett,1993,62(21):269-273.
  • 6Campbell P M,Snow E S,McMarr P J,Fabrication of nanometer-scale conducting silicon wires with a scanning tunneling microscope[J].Solid-state Electronics,1994.37:583-586.
  • 7Campbell P M,Snow E S,McMarr P J.Nanofabrication with proximal probes[J].Surface Science,1996,361:870-873.
  • 8McMarr P J,Mrstik B J,Barger M S,Blanco J R.A study of Si implanted with oxygen using spectroscopic ellipsometry[J].Appl.Phys,1990,67:7211-7222.
  • 9Chow E M,Soh H T,Lee H C,Adams J D,Minne S C,Yaralioglu G,Atalar A.Quate C F,Kenny T W.Integration of through-wafer interconnects with a two-dimensional cantilever array[J].Sensors and Actuators A.,2000,83:118-123.
  • 10Glembocki O J,Dagata J A,Snow E S,Katzer D S.Optical characterization of the electrical properties of processed GaAs[J].Applied Surface Science,1993,63:143-152.

同被引文献12

  • 1宋晓辉,李艳宁,匡登峰,刘庆纲,胡小唐.大气状态下AFM阳极氧化加工Si的研究[J].压电与声光,2006,28(2):209-211. 被引量:1
  • 2DAGATA A, SCHNEIR J, HARAV H, et al. Modification of hydrogen-passivated silicon by a scanning tunneling microscope operating in air [ J ]. Applied Physics Letter, 1990, 56(20): 2001 -2003.
  • 3CAMPBELL P M, SNOW E S. Proximal probe-based fabrication of nanometer-scale devices [ J ]. Materials Science and Engineering, 1998, B51: 173- 177.
  • 4MATSUMOTO K, ISHII M, SEGAWA K. Application of scanning tunneling microscopy nanofabrication process to single electron transistor [ J ]. J Vac Sci Technol, 1996, B14 (2): 1331-1335.
  • 5SASA S, NAKASHIMA A, YODOGAWA S, et al. Magnetotransport properties of InAs nanostructure devices produced by AFM oxidation [ J ]. Physica B, 2002, 314:95-98.
  • 6MOON W C, TATSUO Y, HIROSHI I. Nanotribology of Si oxide layers on Si by atomic force microscopy [ J ]. Ultramicroscopy, 2001, 86:49-53.
  • 7YOSHINOBU T, SUZUKI J, KUROOKA H, et al. AFM fabrication of oxide patterns and immobilization of biomolecules on Si surface [ J ]. Electroehimica Aeta. 2003, 48:3131 -3135.
  • 8BLOEB H, STAIKOV G, SCHULTZE J W. AFM induced formation of SiO2 structures in the electrochemical nanocell [J]. Electrochimica Acta, 2001, 47: 335- 344.
  • 9TEUSCHLER T, MAHR K, MIYAZAKI S, et al. Nanometer-scale modification of the tribological properties of Si ( 100 ) by scanning force microscope [ J ]. Applied Physics Letter, 1995,66 (19) :2499 - 2501.
  • 10YASUTAKE M, EJIRI Y Y, HATTORI T. Modification of silicon surface using atomic force microscope with conducting probe [ J]. Jpn J Appl Phys, 1993, 32: 1021 - 1023.

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