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基于LSM的红外LED加速寿命试验数据的统计分析 被引量:5

Statistic Analysis on Accelerated Life Test Data for Infrared LED Based on LSM
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摘要 利用最小二乘法(LSM)完成了红外发光二极管(LED)恒定与步进应力加速寿命试验数据的统计分析,并自行开发了可视界面和通用性强的寿命预测软件。数值结果证实了红外LED的寿命服从对数正态分布以及加速寿命方程完全符合逆幂定律,并精确地计算出预测该器件寿命所用到的关键性参数,从而使其在很短的时间(1 000 h)内估算寿命成为可能。 Statistic analysis on constant-stress and step-stress accelerated life test data for infrared LED is finished by using least square method (LSM), and the predicted-life software with strong visual interface and versatility is developed by ourselves. The numerical results verified that the infrared LED life submits to logarithmic normal distribution and that the accelerated life equation meets completely the inverse power law. The key parameters used to predict the device life are accurately calculated, which makes it possible that the life is estimated in a short time (1000 h).
作者 张建平
出处 《半导体光电》 EI CAS CSCD 北大核心 2005年第2期92-96,共5页 Semiconductor Optoelectronics
基金 浙江省博士后科研择优资助项目.
关键词 发光二极管 加速寿命试验 LSM 对数正态分布 加速系数 平均寿命 LED accelerated life test LSM logarithmic nor mal distribution accelerated factor mean life
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参考文献4

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共引文献14

同被引文献32

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