摘要
光学畸变普遍存在于高精度光电测量设备系统中,是影响系统测量精度的一个重要因素。在分析多CCD拼接相机结构理论基础上,提出了多CCD拼接相机系统畸变误差模型,同时提出了测量该系统中畸变误差的方法以及修正方法。大量实验结果表明,利用该检测方法与修正方法能够显著提高该系统测量精度,该方法可行且对其他光电测量设备有参考价值。
The miss distance measurement error due to the optical distortion of the CCD camera system is an important factor in the optical system. Based on the theory of the multi-chip CCD butting system, the module of the miss distance theory of optical distortion is proposed. How this measurement error can be checked and corrected are briefly discussed. Actual inspection indicates that the ways mentioned above can correct the miss distance measurement error resulting the optical distortion of the multi-chip CCD butting system and can improve the accuracy of the optical system. And it is suitable for other optical system.
出处
《半导体光电》
EI
CAS
CSCD
北大核心
2005年第2期161-163,共3页
Semiconductor Optoelectronics
关键词
CCD拼接
光学畸变
脱靶量
CCD butting
optical distortion
quantity of mis s distance