摘要
本文以光波在分层媒质中的传播理论及布儒斯特角原理为基础讨论了均匀媒质薄膜 的折射率测量,为均匀媒质薄膜折射率的测量提供了一种简单的方法.
The refractive index measurement was discussed based on the propagating theory of light in multilayer materials and the principle of Brewster angle. Therefore, we can measure the refractive index of homogeneous film by the method.
出处
《物理与工程》
2005年第1期30-31,共2页
Physics and Engineering