丝网印刷制备FeS_2(Pyrite)薄膜及其结构研究

Thin Pyrite(FeS_2) Films Prepared by Screen Print and Study of Films' Structure

本文采用丝网印刷方法制备了Fe S2 (Pyrite)薄膜,用x射线衍射确定了样品Fe S2 (Pyrite)薄膜的晶体结构,讨论了x射线衍射峰强、点阵常数以及晶粒尺寸等随薄膜厚度的变化.并用Rietveld方法对样品的结构进行了精修,确定了样品中S/Fe原子比的变化范围、键长、键角等结构常数.

Iron pyrite(FeS_2) thin films have been prepared using screen print in this paper. x-ray diffraction (XRD) patterns are used to identify the crystal structure of the films. Diffraction peaks intensity, lattice constants and grain sizes changed with the film thickness have been discussed. The procedure used for this study is the full profile refinement of x-ray powder diffraction patterns using the Rietveld method. The S/Fe ratio,bond distances and angles of the samples have been determined.