工程陶瓷磨削表面残余应力的测量新方法

New Measurement Method of Residual Stress for Ground Surface of Engineering Ceramics

磨削加工后工程陶瓷零件表面会产生残余应力。X射线衍射法是用来测量磨削加工后工程陶瓷中残余应力的可靠测量手段。传统的X射线衍射法称之为sin2ψ法,通常只能测量工件表层的残余应力;本文介绍了一种残余应力测量新方法,该方法联合使用sin2ψ法和掠入射X射线衍射法从而得到残余应力在试件中的深度分布。如果考虑X射线的折射,在一系列掠射角下采集到的X射线衍射花样的有效穿透深度和衍射角必须进行折射校正。最后,用这种方法得到的残余应力值是X射线照射的所有层的平均值。

There is residual stress in ground engineering ceramics. X-ray diffraction method is a reliable way to measure it. Conventional X-ray diffraction method is called as sin i// technique, generally, which can only measure residual stress in surface of workpiece. This article introduces a new measurement method by X-ray. The sin2ψ method is combined with the grazing incident X-ray diffraction technique to obtain the depth profiles of the residual stress in the ground samples. Due to refraction of X-rays by the material,it is necessary to make a refraction correction for the effective penetration depth of the X-rays and the measured Bragg angle for the X-ray diffraction patterns collected at grazing incidence range. Finally, it should be realized that the above residual stresses, determined by the X-ray diffraction method, are averaged over the entire irradiated layer of the sample.