扫描近场拉曼显微镜中“热点”处场增强的数值模拟(英文)

The Numerical Simulation of Field Enhancement in “HOT SPOTS” in Scanning Near-Field Raman Microscopy

在本文中我们提出了一种近场扫描光学拉曼显微镜的数值模型,其中,用一个银粒子来模拟扫描尖,一个薄的银膜层来模拟样品的衬底。我们模拟了这种模型在p极化的隐失波的照射下,其热点处的场增强。通过变化银粒子的半径,银膜的厚度以及银粒子与银膜之间的距离。

A numerical model is described wherein a probe is modeled using a silver (Ag) particle and the substrate of the sample is modeled using an Ag thin film, in order to compute the near-field enhancement under the excitation of a p-polarized evanescent wave. By varying the diameter of the Ag particle, the thickness of the Ag thin film, and the distance between the Ag particle and Ag thin film, the optimized values of these three parameters are obtained which produce the strongest field enhancement.