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Characteristics of Schottky Barrier Junction Based on Hexagonal Microtube ZnO

Characteristics of Schottky Barrier Junction Based on Hexagonal Microtube ZnO
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摘要 Hexagonal microtube ZnO was firstly grown on single crystal p-Si (111) substrates by hydrothermal method, and fabricated Ag/n-ZnO and Au/n-ZnO Schottky junction. Schottky effective barrier heights were calculated by I-V measurement. It is confirmed that the presence of a large amount of surface states related possibly to lattice imperfections existed near the surface leads to the pinning of the surface Fermi level at 0.35eV below the conduction-band edge. Then the fabricated Schottky barrier junctions are evaluated for their use as UV photodetectors. Hexagonal microtube ZnO was firstly grown on single crystal p-Si (111) substrates by hydrothermal method, and fabricated Ag/n-ZnO and Au/n-ZnO Schottky junction. Schottky effective barrier heights were calculated by I-V measurement. It is confirmed that the presence of a large amount of surface states related possibly to lattice imperfections existed near the surface leads to the pinning of the surface Fermi level at 0.35eV below the conduction-band edge. Then the fabricated Schottky barrier junctions are evaluated for their use as UV photodetectors.
出处 《Semiconductor Photonics and Technology》 CAS 2005年第2期85-88,106,共5页 半导体光子学与技术(英文版)
基金 National Natural Science Foundation of China(60390073) National"973"Project of China(51310209-4)
关键词 ZNO Schottky barrier junction Characteristic Barrier height Surface state UV photodetector Spectral responsivity ZnO 肖特基势垒 势垒高度 表面态 频谱响应度
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