基于面积加权法的LED光轴测量

Optical axis measurement test of LED with area weighted method

LED由芯片及一定曲率半径的透镜所组成,形成一个发光系统。作为定量探测传感器使用的发光二极管要充分发挥LED光输出特性,使其制作的光电传感器有较高的灵敏度,重要的是要使LED的光轴与透镜系统的机械轴一致,才能得到较大的输出,有必要对其光轴进行测量,采用面积加权平均法进行测量,其光轴的位置不受芯片位置及加载电流的影响。

LED is made of chip and lens with a certain dioptric radius to form a light emitting system. To make the most use of the light emitting property of LED to achieve the super function of the photoelectric sensor made of LED, it is important to make the optical axis of LED in accordance with the mechanical axis of the lens.The necessity of measuring optical axis of LED for photoelectric sensor to do the non-contact quantitative detection is introduced and the measurement of the optical axis with area weighted method is conducted. Finally, the optical axis place affected by chip seat change and loading current change is obtained.