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Finds in Testing Experiments for Model Evaluation 被引量:2

Finds in Testing Experiments for Model Evaluation
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摘要 To evaluate the fault location and the failure prediction models, simulation-based and code- based experiments were conducted to collect the required failure data. The PIE model was applied to simu- late failures in the simulation-based experiment. Based on syntax and semantic level fault injections, a hy- brid fault injection model is presented. To analyze the injected faults, the difficulty to inject (DTI) and diffi- culty to detect (DTD) are introduced and are measured from the programs used in the code-based experi- ment. Three interesting results were obtained from the experiments: 1) Failures simulated by the PIE model without consideration of the program and testing features are unreliably predicted; 2) There is no obvious correlation between the DTI and DTD parameters; 3) The DTD for syntax level faults changes in a different pattern to that for semantic level faults when the DTI increases. The results show that the parameters have a strong effect on the failures simulated, and the measurement of DTD is not strict. To evaluate the fault location and the failure prediction models, simulation-based and code- based experiments were conducted to collect the required failure data. The PIE model was applied to simu- late failures in the simulation-based experiment. Based on syntax and semantic level fault injections, a hy- brid fault injection model is presented. To analyze the injected faults, the difficulty to inject (DTI) and diffi- culty to detect (DTD) are introduced and are measured from the programs used in the code-based experi- ment. Three interesting results were obtained from the experiments: 1) Failures simulated by the PIE model without consideration of the program and testing features are unreliably predicted; 2) There is no obvious correlation between the DTI and DTD parameters; 3) The DTD for syntax level faults changes in a different pattern to that for semantic level faults when the DTI increases. The results show that the parameters have a strong effect on the failures simulated, and the measurement of DTD is not strict.
出处 《Tsinghua Science and Technology》 SCIE EI CAS 2005年第3期298-303,共6页 清华大学学报(自然科学版(英文版)
基金 Supported by the National Natural Science Foundation of China (No. 60373016)
关键词 software testing fault injection failure simulation software engineering software testing fault injection failure simulation software engineering
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  • 1Thanh Binh Nguyen,Chantal Robach,Michel Delaunay.Testability analysis of reactive sotiware[C].Washington:IEEE Interna- tional Workshop on Testability Assessment.IEEE Computer Society,2004:15-25.
  • 2Ming-Chih Shih.Verification and measurement of software component testability[D].San Jose:San Jose State University,2004.
  • 3Tsai W T, Gao Jerry, Wei Xiao,et al.Testability of software in service-oriented architecture[C].Proceedings of the 30th Annual International Computer Software and Applications Conference. IEEE Computer Society,2006:163-170.
  • 4Frank Lammermann, Andre Baresel, Joachim Wegener. Evaluating evolutionary testability for structure-oriented testing with software measurements[J].Applied Soft Computing,2008,8(2): 1018-1028.
  • 5JeffTey M Voas. PIE:A dynamic failure-based technique[J].IEEE Transactions on Software Engineering, 1992,18(8):717- 727.
  • 6Zhao Liang.A new approach for software testability analysis[C]. Proceedings of the 28th International Conference on Sottware Engineering.ACM,2006:985-988.
  • 7Aristides Dasso,Ana Funes.Verification, validation and testing in software engineering[M].US:IGI Global,2006:1-23.
  • 8Gao Jerry, Shih Ming-Chih. A component testability model for verification and measurement[C].Proceedings of the 29th Annual International Computer Software and Applications Conference.IEEE Computer Society,2005:211-218.
  • 9Tsai Tsung-Han,Huang Chin-Yu, Chang Jun-Ru.A study of applying extended pie technique to software testability analysis[C]. 33rd Annual IEEE International Computer Software and Applications Conference.IEEE Computer Society,2009:89-98.
  • 10Supaporn Kansomkeat.An analysis technique to increase testability of class-component[D].Bangkok:Chulalongkom University, 2006.

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