摘要
由于存储器的结构比较复杂,应用又十分广泛,所以一直是国内外测试领域重点研究的课题之一。在研究经典的存储器故障诊断算法的基础上,吸取经典算法的思想,并结合实际需要,提出了一种基于地址移位的存储器故障诊断方法。他克服了以往算法占用计算机存储空间大、诊断耗时长的缺点,简单易行。实践证明,他的故障覆盖率完全满足要求。
Because RAM is very complicated in function and most widely in application, fault diagnosis on RAM becomes one of the keystones in test domain at home and aboard. Several classical fault diagnosis algorithms for RAM are discussed in this paper. Based on this discussion, a new practical method is presented. This method is mainly about address shift. It overcomes the drawbacks of previous methods which calculate taking a long time and occupying large memories. It is easy to realize. Tests prove it is satisfying.
出处
《现代电子技术》
2005年第10期85-88,共4页
Modern Electronics Technique
基金
电子测试技术国家重点实验室资助项目
