摘要
研究保温时间对PMSZT压电陶瓷的相组成、显微结构及电性能的影响。结果发现,烧结温度1240℃保温1h时,密度达极值7.83g/cm3。保温1h的试样,晶粒致密均匀,居里温度最低。随着保温时间的缩短或延长,居里温度增加。电性能在保温1h时达最佳,εT33/ε0=1700,d33=336pC/N,Kp=0.655,Qm=2200,tgδ=0.0030。
The effects of soaking time on crystallographic phase, microstructure and electric-properties of Pb(Mn1/3Sb2/3)0.05 Zr0.47Ti0.48O3 (PMSZT) piezoelectric ceramics have been studied in the paper. X-ray diffraction (XRD) results demonstrated that the pure perovskite structure was obtained and no pyrochlore phase was detected for PMSZT samples sintered at 1240°C for different soaking time. Scanning electron microscopy (SEM) revealed that grains grew up homogeneously and developed well with soaking time of 1 h. The sintered density reached its maximum value of 7.83 g/cm3 and a well-situated property of Ε33T/Ε0 (1700), d33(336 pC/N), Kp(0.62), Qm(2200), tgδ(0.0030) were obtained at sintering of 1240°C for 1 h. The Curie temperature had a minimum value with soaking time of 1 h. When soaking time prolonging or shortening, the Curie temperature moved to a high temperature.
出处
《功能材料》
EI
CAS
CSCD
北大核心
2005年第6期948-951,共4页
Journal of Functional Materials
基金
ProjectsupportedbyNationalNaturalScienceFoundationofChina(10232030)
KeyLaboratoryforAdvancedCeramicsandMachiningTechnologyofMinistryofEducationofTianjinUniversity(x06050)
关键词
PMSZT压电陶瓷
保温时间
相组成
显微结构
电性能
Electric properties
Grain growth
Microstructure
Perovskite
Piezoelectric materials
Scanning electron microscopy
Sintering
X ray diffraction analysis