摘要
本文分析了微电子器件的发展趋势,论述了微电子器件的测试筛选与质量控制的关系。重点结合了华峰测控的STS2100系列测试系统介绍了各种微电子器件的相关测试技术,同时也介绍了测试失效分析及其重要性。
In this paper, the author will analyze the developing trend of micro-electronics,illustrate the contacts between Test & Select and quality control.He puts his emphasis on all kinds of test technology of micro-electronics combining with the STS 2100 system tested & controlled by Huafeng.
出处
《电子质量》
2005年第6期8-10,共3页
Electronics Quality
