摘要
嵌入式内核结构的测试正面临着新的挑战,需要提出有效的测试方法。针对IP内核模块测试所面临的技术难点,详细介绍了IP核模块实现测试所需要构建的硬件环境和完整的测试方法,并分析了由测试理论和方法而形成的国际公认标准IEEEP1500。
Testing embedded IP(intellectual property) cores pose great challenge, and an effective test methodology for IP cores are needed.A novel test methodology is described in this paper along with its structure.The IEEE P1500 standards of test schemes are also analyzed.
出处
《电子工业专用设备》
2005年第6期54-56,66,共4页
Equipment for Electronic Products Manufacturing
