摘要
用提拉法成功地生长了具有La3Ga5SiO14(LGS)结构的A3BGa3Si2O14(A=Ca,Sr;B=Nb,Ta)系列单晶;用X-射线粉末衍射证明了其单晶结构,并在200~3200nm间测其透过谱。
A series of single crystals A_3BGa_3Si_2O_(14)(A=Ca,Sr; B=Nb,Ta) with langasite structure were successfully grown using the Czochralski (CZ) method. The single crystals structure were investigated by X-ray powder diffraction (XRPD) experiments. The transmittance spectra from 200 nm to 3 200 nm were measured.
出处
《压电与声光》
CSCD
北大核心
2005年第3期280-282,共3页
Piezoelectrics & Acoustooptics
基金
国家自然科学基金资助项目(60178029)
关键词
提拉法
结构
X-射线粉末衍射
透过谱
Czochralski technique
structure
X-ray powder diffraction
transmittance properties