CCD光幕靶交汇测量精度研究

Research on the Precision of the Confluent Measurement of CCD Veiling Target

介绍了CCD交汇测量原理,分析和研究了CCD实际布站时所产生的各种结构误差,并且结合一定的实际试验数据,得出对交汇测量精度影响的决定性因素,这对交汇测量系统的建立具有很重要的现实意义。

This paper introduces the principle of CCD confluent measurement, analyzes and researches on various structural errors produced in CCD actual arrangement, and connecting with some actual test data, provides some crucial factors influencing the precision of the confluent measure ment, which possesses very important actual significance for the establishment o f the confluent measurement system.