期刊文献+

低膨胀系数底充胶对倒装焊焊点疲劳可靠性的影响 被引量:1

Affects of Low Thermal Expansion Coefficient under fill on Reliability of Flip Chip Solder Joint
下载PDF
导出
摘要 采用了填充碳纤维、二氧化硅(Silica)的环氧树脂倒装焊底充胶,因为碳纤维具有负热膨胀系数,比单独填加了二氧化硅的底充胶热膨胀系数低很多,仿真和实验结果表明焊点的热疲劳寿命比填充普通的环氧树脂底充胶大大提高。又与Engelmaier提出的焊点寿命预测模型[E W]进行了比较,结果表明Coffin Manson形式的焊点疲劳寿命模型比实际寿命估计得要高。 Carbon fiber and silica filled epoxy is studied as underfill in flip chip.Because of the negative thermal expansion coefficient of carbon fiber,this underfill has much lower thermal expansion coefficient than that of silica filled epoxy or epoxy underfill. Simulation and experiment results prove that it can greatly increase the faigue life of flip chip solder joints than that of silica filled epoxy or only epoxy itself as underfill.Compared with Engelmaier's solder joints prediction fatigue life model,Coffin-Manson's model is highly evaluated than that of[E-W]model and practical experimental fatigue life.
出处 《机械设计与研究》 CSCD 北大核心 2005年第3期68-70,共3页 Machine Design And Research
基金 国家自然科学基金资助项目(60166001)
关键词 热膨胀系数 电子封装 疲劳 底充胶 倒装焊 thermal expansion coefficient Micro electronic packaging fatigue Underfill Flip Chip
  • 相关文献

参考文献10

  • 1L S Goldmann, R J Herdizk, N G Koopman etc. Lead Indium for Controlled Collapse Chip Joining [ A ]. 27th Electronic Components Conference Procee [C]. 1977 25.
  • 2Engelmaier. Solder Joint reliability [J ]. Global SMT & Packaging,2002,8:35~36.
  • 3Vadim Gektin,Avram Bar-Cohen and Jeremy Ames. Coffin-Manson Fatigue Model of Underfilled Flip Chip[J]. IEEE Trans. on CPMT. 1997,20 : 317~325.
  • 4H Doi, K Kawano, A Yasukawa, etc. Reliability of Underfill-Encapsulated Flip-Chip With Heat Spreaders[J ]. J. Elect. Packaging, 1988,120:322~327.
  • 5K Darbha,J H Okura and A Dasgupta. Impact of Underfill filler paticles on Reliability of Flip-Chip Interconnects [ J ]. IEEE Trans. On CPMT, 1998,21 (2) :275~279.
  • 6S Hans and K K wang. Study on the Pressurized Underfill Encapsulation of Flip-Chips[ J ]. IEEE Trans. On CMPT, 1997,20(4) :434~442.
  • 7C P Wang, M B Vincent and S Shi. Fast-flow Underfill Encapsulant:Flow Rate and Coefficient of Thermal Expansion[J ]. IEEE Trans. On CPMT, 1988,21(2) : 360 ~ 363.
  • 8P Palaniappan and D f Baldwin. Preliminary inprocess stress analysis of flip chip assembly during underfill [ A ]. Proc. 30th Int.Symp. Microelectro[ C] 1997: 579~ 585.
  • 9D G Yang, G Q Zhang. Combined Experimental Investigation on Flip Chip Solder Fatigue with Cure Dependent Underfill Properties[A]. Proceeding of 51st IEEE Electron Component Tech.Conf. [C]. 2001,2518~2524.
  • 10王国忠,陈柳,程兆年.电子封装SnPb钎料和底充胶的材料模型及其应用[J].机械工程学报,2000,36(12):33-38. 被引量:7

二级参考文献2

共引文献6

同被引文献5

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部