一种基于核设计的SOC测试控制体系结构

Test Control Architecture for System-on-Chip Based on Core-design

随着集成电路复杂性的提高和SOC系统的出现,电路测试的难度也在不断增大,测试问题已经成为SOC设计的瓶颈。在研究了现存的测试控制结构后提出了基于核设计的SOC测试控制结构,它以边界扫描控制体系为基础,融合多种测试控制方法,支持不同类型的IP核进行测试。从而解决了SOC测试中控制部分的一些问题。

Along with the more complicacy of integrated circuit and the emergency of SOC system, the test of IC has become more difficult and this problem has been as the bottleneck of the SOC design. A test control architecture for core-based design is presented after studying some kinds of test control structures, basing on the boundary scan control system.This structure embraces some test techniques and can support different types of IP cores to test. This technique solves some questions of test control in SOC design.