TS及PTS聚合过程的介电性质研究

DIELECTRIC PROPERTIES OF BIS-(p-TOLUENE SULPHONATE) OF 2,4-HEXADIYNE-l,6-DIAL (TS) AND EFFECT OF THE SOLID STATE POLYMERIZATION

测量了TS的介电常数与温度的关系,在160K和203K附近观察到异常;同时也跟踪测量了TS在固态聚合过程中介电常数与聚合度的关系,发现在聚合初期,介电常数先是下降,当聚合度高于30％时,介电常数迅速上升。我们认为这些变化与侧链极性基团和碳链π电子的行为有关,并对此进行了定性的讨论。

The temperature dependence of the dielectric constant of monomer single crystal TS has been determined for the range 77-300 K, two anomalies have been observed near 160 K and 203 K. The variation of the dielectric constant of TS during thermal solid state polymerization is obtained. It the initial stage of polymerization, the dielectric constant decreases slowly; when sample conversion to polymer exceeds 30%, the dielectric constant increases rapidly. We suggest that this behavior may be related to side-group and π-electron and hend explain the results qualitativly.