摘要
采用有前单色器的普通X射线衍射仪,分别用微分和积分方法测量了γ射线辐照LiF晶体中缺陷集团的黄昆漫散射。黄昆漫散射的分布表明,LiF晶体中辐照缺陷集团的应变场接近于各向同性。
Using X-ray diffractometer equipped with a premonochromator, X-ray Huang diffuse scattering from defects in γ irradiated LiF crysial has been measured with differential and integral methods. The results show that the strain field of irradiation defects in LiF crystal is nearly isotropic.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
1989年第4期529-533,共5页
Acta Physica Sinica
基金
中国科学院科学基金