摘要
介绍了有关大容量存储器集成电路测试系统的软件原理和硬件构成,对大容量存储器集成电路的测试方法作了初步探讨,希望对实现实验室精确测试和生产中大批量芯片中测和成品测试有所帮助。
The software scheme and hardware connections of testing system for MSF memory IC are introduced,and the testing technology of MSF memory IC are preliminary discussed in this paper.Wish it is available to exactly test in laboratory,large quantilies chip and finished product test in produce process.Go-ahead with craft brothers together on the testing technique and testing equpment of MSF IC.
出处
《电子工业专用设备》
2005年第5期49-52,共4页
Equipment for Electronic Products Manufacturing
基金
02C26214400408
科技部财政司批准文号:国科发计字[2002]450号
