用蒙特-卡罗方法模拟质子X荧光分析中的荧光增强因子

THE MONTE-CARLO SIMULATION OF THE FLUORESCENCE ENHANCING EFFECT IN PIXE

本文用蒙特-卡罗方法模拟质子激发X荧光分析中的一次和二次荧光强度,从而得到荧光增强因子。 文中利用模拟计算程序,在改变入射质子能量、入射角、x射线出射角及分析样品的成分和含量的条件下,分别计算了荧光增强因子。此外,还计算了质子激发标准合金钢样品的荧光增强因子,得到的结果与标准样品的标定成份基本一致。

With monte-carlo method, the primary and second X-ray fluorescence excited by proton in thick target were simulated, and the fluorescence enhancing factors were obtained. The various enhancing factors were calculated with different proton incident energies and angles, X-ray ejection angles, and elements and their weight percentage in samples. Besides, the results of PIXE basically agreed with standard composition of steel samples using the calculated enhancing factors.