摘要
通过静电放电效应实验和理论分析,研究了IEC6100042标准规定的实验方法与实验平台的局限性,提出了改进的ESD电磁场理论模型,探讨了静电放电电磁脉冲对微电子器件作用机理,提出了相应防护对策。
Based on the experimental and theoretical analysis of Electrostatic Discharge effect,the paper discusses about limitation of the experiment method and experiment flat which prescribed by IEC61000-4-2.It presents the improved ESD electromagnetic field theory model,and explores the function mechanism of microelectronic device from electrostatic discharge elect romagnetism impulse,puts forword the corresponding protection countermeasure.
出处
《河北科技大学学报》
CAS
2005年第2期87-92,共6页
Journal of Hebei University of Science and Technology