邻苯二甲酸氢钾(KAP )单晶中包裹物的X射线衍射形貌衬度

X-RAY TOPOGRAPHIC CONTRAST OF INCLUSIONS IN CRYSTAL OF POTASSIUM ACID PHTHALATE

本文描述邻苯二甲酸氢钾(KAP)单晶中包裹物的X射线衍射形貌衬度及其本质的测定结果。提出应用“包裹物点缀”形貌技术测定单晶中大面积应变区本质的实验方法和结果,为深入了解晶体结构内部薄弱环节提供另一可行的途径。

X-ray topographic contrast of inclusions in the crystal of potassium acid phthalate (KAP) has been studied experimentally and theoretically. The nature of inclusion formation was determined in view of their black and white contrast. An 'Inclusion Decoration Method' for use in determining the nature of the strained regions in the crystal with very large areas has been proposed. The results together with such an analysis technique are presented in this paper. It has provided a practical way to identify the structural weakness in single crystals.