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一种紧凑性指标最小的抗误判算法 被引量:3

A Kind of Anti-aliasing Test Generation Algorithm with the Minimal Compact Index
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摘要 影响测试向量集对所有故障进行准确定位的原因主要是由于存在两类问题:征兆误判问题和征兆混淆问题,而征兆误判问题对故障诊断准确性的影响更大。论文分析了测试向量生成中的征兆误判现象,结合现有的抗误判测试向量生成算法,从紧凑性角度考虑,得到了一种紧凑性指标最小的抗误判算法。该算法不仅避免了征兆误判现象,而且减小了紧凑性指标,缩短了测试时间。 Aliasing syndrome and confounding syndrome are the two causes of affecting the diagnostic capability of test generation algorithm, aliasing syndrome is the most important cause. In this paper, the aliasing syndrome phenomenon of test vector generation and some existing anti-aliasing test generation algorithm are discussed in detail, a kind of anti-aliasing algorithm with the minimal compact index is proposed through considering the compact index. This algorithm avoided the phenomenon of aliasing syndrome, minimized the compact index and shortened the test time.
机构地区 装甲兵工程学院
出处 《微电子学与计算机》 CSCD 北大核心 2005年第5期159-161,165,共4页 Microelectronics & Computer
关键词 边界扫描 优化 算法 征兆误判 紧凑性指标 Boundary-scan, Optimization, Algorithm, Aliasing syndrome, Compact index
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参考文献6

  • 1胡政.[D].长沙:国防科技大学机电工程及自动化学院,2000.
  • 2Najmi Jarwala and Chi W Yau. A New Framework for Analyzing Test Generation and Diagnosis Algorithms for Wiring Interconnects. Intl Test Conf, 1989: 63~70.
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二级参考文献6

  • 1IEEE Standard Test Access Port and Boundary-Scan Archirecture,IEEE Std 1149.1-1990.
  • 2M.V. Tegethoff K. P. Parker "IEEE Std 1149. I Where Are We? Where From Here" IEEE D&T of Computers Summer 1995, pp53-59.
  • 3W.k. Kautz,"Testing of Faults in Wiring Interconnects" ,IEEE Transaction on Computer Vol C-23,No. 4,1974,pp.358-363.
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  • 6Najmi Jarwala and Chi W. Yau "A New Framework for analyzing Test Generation and Diagnosis Algorithms for Wiring Interconnects Proc. Intl. Test Conf. 1989,pp. 63-70.

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