微量相X射线衍射定量分析的一种简便方法

A Simple Method of Quantitative Analysis by X-Ray Diffraction for Small Amount Phase

阐述了关于微量相X射线衍射定量分析的一种简便方法———近似线性关系法,它适用于二相体系(或基体吸收系数基本恒定的多相体系)材料中微量相的定量分析。该方法不需要在待测样品中加入参考物相,分析时仅需对一条衍射线进行测定,因而分析时间很短,其测定结果与实际含量的相对误差为-10.2%～+21.4%,与外标法和内标法的测量结果的精度相当。

Under certain conditions, the relationship between t he diffraction intensity and content of small amount phase in a sample is approxim ately linear. Based on that, the process of X-ray quantitative phase analysis c an be simplified. To determine the content of the analyzed phase in a sample it ′s sufficient to measure the intensities of the phase in both the analyzed samp le and the standard sample. This simple method can be used for quantifying the s mall amount phase in two-phase materials (or materials of which the mass absorp tion coefficient of the matrix approximates to that of the standard sample). It is not necessary to add reference phase to samples in this method and only one diffraction line needs to be measured in the test process, so the test is usuall y simpler and quicker than whole-powder-pattern fitting quantitative analysis. Its relative error, -10.2%～+21.4%, is close to those of external and internal standard methods.