摘要
利用ATMEL公司的高速嵌入式单片机实现MEMS加速度计性能指标的自动测试,对系统中的模拟地与数字地分离、正负电压上电时间控制、温度信息采集、串口通讯协议等细节作了详细分析。结果表明,这是一个低价而可靠的微加速度计自动测试解决方案。
An automatic measuring system based on the monolithic computer of ATMEL Corporation was introduced,according to the criterion of the measuring of micro-accelerometer.The A/D grounds separation,the time-lapse of P/N voltage,the temperature collection and the serial port protocol were analyzed.The results show that this is a low-cost and credible solution for micro-accelerometer auto-measurement.
出处
《微纳电子技术》
CAS
2005年第7期329-332,共4页
Micronanoelectronic Technology
基金
国家"十五"科技攻关项目(41308050103)
关键词
微加速度计
温度采集
自动测试
micro-accelerometer
temperature collection
automatic measuring