摘要
通过理论分析得出,碳纳米管针尖的长度过长会影响其成像的稳定性的结论,然后在原子力显微镜上运用电蚀的方法对碳纳米管针尖的长度进行优化,结果显示,截短后的碳纳米管针尖能够获得稳定的高分辨率成像,从而解决了碳纳米管针尖制造中针尖长度优化这一关键技术问题。
Theoretical analysis showed that for long nanotubes elastic response causes the nanotube tip to jump into contact with the surface and renders it unsuitable for imaging. Then the length of a nanotube tip was decreased by electrical etching on a conductive surface using AFM to reduce the amplitude of vibration to a level where it does not affect resolution. Consequently, key technologies of nanotube tip fabrication was studied.
出处
《中国机械工程》
EI
CAS
CSCD
北大核心
2005年第13期1181-1183,共3页
China Mechanical Engineering
基金
国家自然科学基金资助项目(10332020)
中国博士后基金资助项目(20040350320)
关键词
碳纳米管
针尖制造
长度优化
原子力显微镜
carbon nanotube
tip fabrication
optimization of tip length
atomic force microscope